FIB is a method used for analysis, deposition, edit and ablation of materials at a specific site.  FIB is very similar to SEM (Scanning Electron Microscopy) except, that FIB uses a focused ion beam and SEM uses a focused electron beam to image a specimen inside a chamber.  Chip Compass Lab is equiped with advanced FIB model FEI Helios 460, with strength and application as below:

• High quality TEM sample preparation.
• Examining products with small, difficult-to-access features.
• Rapid, high-resolution SEM imaging.